Running the full test suite takes a long time. It would be useful to distribute tests across multiple sandbox instances to speed up testing. Add support for running tests in parallel across multiple sandbox instances. Each worker runs a subset of tests based on its worker ID. Add -P<n>:<w> option to the ut command where n is the total number of workers and w is this worker's ID (0 to n-1). Tests are distributed by index modulo number of workers. Series-to: u-boot Series-cc: heinrich Cover-letter: test: Various improvements to unit-test infrastructure This series adds several improvements to the unit-test infrastructure: - Move disk images to the persistent-data directory so they don't pollute the source tree - Add a way to keep pytest-created artefacts for faster iteration on C tests - Add a helper to simplify running manual unit tests from Python - Allow combined flags with the ut command (e.g. -Efm) - Add a -E flag to emit machine-readable result lines - Add a -P flag to distribute tests across parallel workers - Add -m as an alias for -f (force manual tests) These changes make it easier to run and debug tests, especially when iterating on C test code. END Co-developed-by: Claude Opus 4.5 <noreply@anthropic.com> Signed-off-by: Simon Glass <simon.glass@canonical.com>
432 lines
12 KiB
C
432 lines
12 KiB
C
/* SPDX-License-Identifier: GPL-2.0+ */
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/*
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* Copyright (c) 2013 Google, Inc.
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*/
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#ifndef __TEST_TEST_H
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#define __TEST_TEST_H
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#include <malloc.h>
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#include <linux/bitops.h>
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#define UT_MAX_ARGS 8
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#define UT_PRIV_SIZE 256
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/**
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* struct ut_stats - Statistics about tests run
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*
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* @fail_count: Number of tests that failed
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* @skip_count: Number of tests that were skipped
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* @test_count: Number of tests run. If a test is run muiltiple times, only one
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* is counted
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* @start: Timer value when test started
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* @duration_ms: Suite duration in milliseconds
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*/
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struct ut_stats {
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int fail_count;
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int skip_count;
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int test_count;
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ulong start;
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ulong duration_ms;
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};
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/**
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* enum ut_arg_type - Type of a unit test argument
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*
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* @UT_ARG_INT: Integer argument (hex with 0x prefix, or decimal) -> vint
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* @UT_ARG_BOOL: Boolean argument (0 or 1) -> vbool
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* @UT_ARG_STR: String argument -> vstr
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*/
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enum ut_arg_type {
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UT_ARG_INT,
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UT_ARG_BOOL,
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UT_ARG_STR,
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};
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/**
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* struct ut_arg - Parsed unit test argument value
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*
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* Holds the parsed value of an argument after command-line processing.
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*
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* @name: Name of the argument (points to ut_arg_def.name)
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* @type: Type of the argument
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* @provided: true if value was provided on command line
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* @vint: Integer value (when type is UT_ARG_INT)
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* @vbool: Boolean value (when type is UT_ARG_BOOL)
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* @vstr: String value (when type is UT_ARG_STR, points into argv)
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*/
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struct ut_arg {
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const char *name;
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enum ut_arg_type type;
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bool provided;
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union {
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long vint;
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bool vbool;
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const char *vstr;
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};
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};
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/*
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* struct unit_test_state - Entire state of test system
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*
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* @cur: Statistics for the current run
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* @total: Statistics for all test runs
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* @run_count: Number of times ut_run_list() has been called
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* @worst: Sute which had the first per-text run time
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* @worst_ms: Time taken by that test
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* @start: Store the starting mallinfo when doing leak test
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* @of_live: true to use livetree if available, false to use flattree
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* @of_root: Record of the livetree root node (used for setting up tests)
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* @root: Root device
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* @testdev: Test device
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* @force_fail_alloc: Force all memory allocs to fail
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* @skip_post_probe: Skip uclass post-probe processing
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* @fdt_chksum: crc8 of the device tree contents
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* @fdt_copy: Copy of the device tree
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* @fdt_size: Size of the device-tree copy
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* @other_fdt: Buffer for the other FDT (UTF_OTHER_FDT)
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* @other_fdt_size: Size of the other FDT (UTF_OTHER_FDT)
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* @of_other: Live tree for the other FDT
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* @runs_per_test: Number of times to run each test (typically 1)
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* @force_run: true to run tests marked with the UTF_MANUAL flag
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* @workers: Number of parallel workers, 0 if not sharding tests
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* @worker_id: ID of this worker (0 to workers-1)
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* @old_bloblist: stores the old gd->bloblist pointer
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* @soft_fail: continue execution of the test even after it fails
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* @expect_str: Temporary string used to hold expected string value
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* @actual_str: Temporary string used to hold actual string value
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* @args: Parsed argument values for current test
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* @arg_count: Number of parsed arguments
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* @arg_error: Set if ut_str/int/bool() detects a type mismatch
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* @keep_record: Preserve console recording when ut_fail() is called
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* @emit_result: Emit result line after each test completes
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* @priv: Private data for tests to use as needed
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*/
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struct unit_test_state {
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struct ut_stats cur;
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struct ut_stats total;
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int run_count;
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const struct suite *worst;
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int worst_ms;
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struct mallinfo start;
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struct device_node *of_root;
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bool of_live;
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struct udevice *root;
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struct udevice *testdev;
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int force_fail_alloc;
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int skip_post_probe;
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uint fdt_chksum;
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void *fdt_copy;
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uint fdt_size;
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void *other_fdt;
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int other_fdt_size;
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struct device_node *of_other;
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int runs_per_test;
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bool force_run;
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int workers;
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int worker_id;
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void *old_bloblist;
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bool soft_fail;
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char expect_str[1024];
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char actual_str[1024];
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struct ut_arg args[UT_MAX_ARGS];
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int arg_count;
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bool arg_error;
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bool keep_record;
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bool emit_result;
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char priv[UT_PRIV_SIZE];
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};
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/* Test flags for each test */
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enum ut_flags {
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UTF_SCAN_PDATA = BIT(0), /* test needs platform data */
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UTF_PROBE_TEST = BIT(1), /* probe test uclass */
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UTF_SCAN_FDT = BIT(2), /* scan device tree */
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UTF_FLAT_TREE = BIT(3), /* test needs flat DT */
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UTF_LIVE_TREE = BIT(4), /* needs live device tree */
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UTF_CONSOLE = BIT(5), /* needs console recording */
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UTF_NO_SILENT = BIT(6), /* console cannot be silent */
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/* do extra driver model init and uninit */
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UTF_DM = BIT(7),
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UTF_OTHER_FDT = BIT(8), /* read in other device tree */
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/*
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* Only run if explicitly requested with 'ut -f <suite> <test>'. The
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* test name must end in "_norun" so that pytest detects this also,
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* since it cannot access the flags.
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*/
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UTF_MANUAL = BIT(9),
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UTF_ETH_BOOTDEV = BIT(10), /* enable Ethernet bootdevs */
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UTF_SF_BOOTDEV = BIT(11), /* enable SPI flash bootdevs */
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UFT_BLOBLIST = BIT(12), /* test changes gd->bloblist */
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UTF_INIT = BIT(13), /* test inits a suite */
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UTF_UNINIT = BIT(14), /* test uninits a suite */
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};
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/**
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* enum ut_arg_flags - Flags for unit test arguments
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*
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* @UT_ARGF_OPTIONAL: Argument is optional; use default value if not provided
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*/
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enum ut_arg_flags {
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UT_ARGF_OPTIONAL = BIT(0),
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};
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/**
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* struct ut_arg_def - Definition of a unit test argument
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*
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* Declares an expected argument for a test, including its name, type,
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* whether it is optional, and its default value.
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*
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* @name: Name of the argument (used in key=value matching)
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* @type: Type of the argument (int, bool, or string)
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* @flags: Argument flags (e.g., UT_ARGF_OPTIONAL)
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* @def: Default value (used when argument is optional and not provided)
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*/
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struct ut_arg_def {
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const char *name;
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enum ut_arg_type type;
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int flags;
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union {
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long vint;
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bool vbool;
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const char *vstr;
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} def;
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};
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/**
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* struct unit_test - Information about a unit test
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*
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* @name: Name of test
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* @func: Function to call to perform test
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* @flags: Flags indicated pre-conditions for test
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* @arg_defs: Argument definitions (NULL-terminated array), or NULL
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*/
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struct unit_test {
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const char *file;
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const char *name;
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int (*func)(struct unit_test_state *state);
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int flags;
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const struct ut_arg_def *arg_defs;
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};
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/**
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* UNIT_TEST() - create linker generated list entry for unit a unit test
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*
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* The macro UNIT_TEST() is used to create a linker generated list entry. These
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* list entries are enumerate tests that can be execute using the ut command.
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* The list entries are used both by the implementation of the ut command as
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* well as in a related Python test.
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*
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* For Python testing the subtests are collected in Python function
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* generate_ut_subtest() by applying a regular expression to the lines of file
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* u-boot.sym. The list entries have to follow strict naming conventions to be
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* matched by the expression.
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*
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* Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
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* foo that can be executed via command 'ut foo bar' and is implemented in
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* function foo_test_bar().
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*
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* @_name: concatenation of name of the test suite, "_test_", and the name
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* of the test
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* @_flags: an integer field that can be evaluated by the test suite
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* implementation (see enum ut_flags)
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* @_suite: name of the test suite concatenated with "_test"
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*/
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#define UNIT_TEST(_name, _flags, _suite) \
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ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \
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.file = __FILE__, \
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.name = #_name, \
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.flags = _flags, \
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.func = _name, \
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}
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/* init function for unit-test suite (the 'A' makes it first) */
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#define UNIT_TEST_INIT(_name, _flags, _suite) \
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ll_entry_declare(struct unit_test, A ## _name, ut_ ## _suite) = { \
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.file = __FILE__, \
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.name = #_name, \
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.flags = (_flags) | UTF_INIT, \
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.func = _name, \
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}
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/* uninit function for unit-test suite (the 'aaa' makes it last) */
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#define UNIT_TEST_UNINIT(_name, _flags, _suite) \
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ll_entry_declare(struct unit_test, zzz ## _name, ut_ ## _suite) = { \
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.file = __FILE__, \
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.name = #_name, \
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.flags = (_flags) | UTF_UNINIT, \
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.func = _name, \
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}
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/**
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* UNIT_TEST_ARGS() - create unit test entry with inline argument definitions
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*
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* Like UNIT_TEST() but allows specifying argument definitions inline.
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* The variadic arguments are struct ut_arg_def initializers. The NULL
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* terminator is added automatically by the macro.
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*
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* Example:
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* UNIT_TEST_ARGS(my_test, UTF_CONSOLE, my_suite,
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* { "path", UT_ARG_STR },
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* { "count", UT_ARG_INT, UT_ARGF_OPTIONAL, { .vint = 10 } });
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*
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* @_name: Test function name
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* @_flags: Test flags (see enum ut_flags)
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* @_suite: Test suite name
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* @...: Argument definitions (struct ut_arg_def initializers)
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*/
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#define UNIT_TEST_ARGS(_name, _flags, _suite, ...) \
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static const struct ut_arg_def _name##_args[] = { __VA_ARGS__, { NULL } }; \
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ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \
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.file = __FILE__, \
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.name = #_name, \
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.flags = _flags, \
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.func = _name, \
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.arg_defs = _name##_args, \
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}
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/* Get the start of a list of unit tests for a particular suite */
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#define UNIT_TEST_SUITE_START(_suite) \
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ll_entry_start(struct unit_test, ut_ ## _suite)
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#define UNIT_TEST_SUITE_COUNT(_suite) \
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ll_entry_count(struct unit_test, ut_ ## _suite)
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/* Use ! and ~ so that all tests will be sorted between these two values */
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#define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!)
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#define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~)
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#define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())
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/* Sizes for devres tests */
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enum {
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TEST_DEVRES_SIZE = 100,
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TEST_DEVRES_COUNT = 10,
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TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
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/* A few different sizes */
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TEST_DEVRES_SIZE2 = 15,
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TEST_DEVRES_SIZE3 = 37,
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};
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/**
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* testbus_get_clear_removed() - Test function to obtain removed device
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*
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* This is used in testbus to find out which device was removed. Calling this
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* function returns a pointer to the device and then clears it back to NULL, so
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* that a future test can check it.
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*/
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struct udevice *testbus_get_clear_removed(void);
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#ifdef CONFIG_SANDBOX
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#include <asm/state.h>
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#include <asm/test.h>
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#endif
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static inline void arch_reset_for_test(void)
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{
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#ifdef CONFIG_SANDBOX
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state_reset_for_test(state_get_current());
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#endif
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}
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static inline int test_load_other_fdt(struct unit_test_state *uts)
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{
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int ret = 0;
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#ifdef CONFIG_SANDBOX
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ret = sandbox_load_other_fdt(&uts->other_fdt, &uts->other_fdt_size);
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#endif
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return ret;
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}
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/**
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* Control skipping of time delays
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*
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* Some tests have unnecessay time delays (e.g. USB). Allow these to be
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* skipped to speed up testing
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*
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* @param skip_delays true to skip delays from now on, false to honour delay
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* requests
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*/
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static inline void test_set_skip_delays(bool skip_delays)
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{
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#ifdef CONFIG_SANDBOX
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state_set_skip_delays(skip_delays);
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#endif
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}
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/**
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* test_set_eth_enable() - Enable / disable Ethernet
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*
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* Allows control of whether Ethernet packets are actually send/received
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*
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* @enable: true to enable Ethernet, false to disable
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*/
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static inline void test_set_eth_enable(bool enable)
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{
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#ifdef CONFIG_SANDBOX
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sandbox_set_eth_enable(enable);
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#endif
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}
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/* Allow ethernet to be disabled for testing purposes */
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static inline bool test_eth_enabled(void)
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{
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bool enabled = true;
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#ifdef CONFIG_SANDBOX
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enabled = sandbox_eth_enabled();
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#endif
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return enabled;
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}
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/* Allow ethernet bootdev to be ignored for testing purposes */
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static inline bool test_eth_bootdev_enabled(void)
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{
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bool enabled = true;
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#ifdef CONFIG_SANDBOX
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enabled = sandbox_eth_enabled();
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#endif
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return enabled;
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}
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/* Allow SPI flash bootdev to be ignored for testing purposes */
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static inline bool test_sf_bootdev_enabled(void)
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{
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bool enabled = true;
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#ifdef CONFIG_SANDBOX
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enabled = sandbox_sf_bootdev_enabled();
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#endif
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return enabled;
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}
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static inline void test_sf_set_enable_bootdevs(bool enable)
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{
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#ifdef CONFIG_SANDBOX
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sandbox_sf_set_enable_bootdevs(enable);
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#endif
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}
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static inline bool test_flattree_test_enabled(void)
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{
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#ifdef CONFIG_SANDBOX
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struct sandbox_state *state = state_get_current();
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return !state->no_flattree_tests;
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#else
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return true;
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#endif
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}
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static inline bool test_soft_fail(void)
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{
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#ifdef CONFIG_SANDBOX
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struct sandbox_state *state = state_get_current();
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return state->soft_fail;
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#else
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return false;
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#endif
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}
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#endif /* __TEST_TEST_H */
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